Visible Spectrophotometer LVS-A30 is single beam, blazed holographic optical system with 320 to 1100 nm wavelength range, and offers spectral bandwidth of 2.0 nm. Designed with Large LCD display (128 × 64 Dots), it display curve and high quality grating, detector and lamps. Features with T, A, C work mode and Tungsten lamp & Deuterium lamp (Pre-aligned). Designed with holographic blazed grating monochromator has the advantages of high wavelength accuracy, good monochromaticity and low stray light. It offers high accuracy, good reproducibility and stability of measurement reading instrument.
| Wavelength range | 320 to 1100 nm |
|---|---|
| Spectral bandwidth | 2.0 nm |
| Wavelength Accuracy | ± 0.8 nm |
| Wavelength Repeatability | ≤ 0.3 nm |
| Optical system | Single beam, blazed holographic Grating (1200 lines/mm) |
| Photometric Range | 0 to 200 %T, -0.3 to 3 A, 0 to 9999 C |
| Photometric Accuracy | ± 0.002A (0 to 0.5A), ±0.004 A (0.5 to 1A), ±0.5 % T (0 to 100% T) |
| Photometric Repeatability | ≤ 0.001A (0 to 0.5 A), ≤0.002A (0.5 to 1A), ≤0.2 % T (0 to 100% T) |
| Detector | Silicon Photocell |
| Stray light | ≤ 0.1% T (220/360 nm) |
| Noise | ≤0.2 % T/3 min (250/500 nm, 0% T), ≤ 0.5% T/3 min (250/500 nm, 100% T) |
| Scan speed | High, Medium, Low, Max. 2000 nm/minute |
| Baseline flatness | ± 0.003 A |
| Stability | ± 0.002 A/h (500 nm, 0A) |
| Sample compartment | Accommodates 5 to 100 nm Path length cuvette |
| Lamps | Tungsten lamp & Deuterium lamp (Pre-aligned) |
| Display | Graphic LCD (128 × 64 Dots) |
| Keyboard | 22 key Numeric membrane keyboard |
| Output Port | USB Port & RS232 Port |
| Printer | Mini Serial Printer, PC printer |
| PC software | Optional PC scanning software |
| Dimension | 490 × 390 × 280 mm |
| Power supply | AC 90 to 250 V, 50/60 Hz |
| Gross weight | 16 kg |
Visible Spectrophotometer is used in high requirement for precision measurement in the research and production of organic chemistry, biochemistry, medical testing, food testing, environmental protection, water testing industries, etc.
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