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XRF-Spectrometer LXRF-A10

XRF-Spectrometer LXRF-A10

XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.

  • Measureable elements S to U
    Detection limit 1 ppm
    Temperature 15 ~ 30 °C
    Elemental content 1 ppm to 99 %
    Repeatability 0.001
    Stability 0.001
    Power supply AC 220 V ± 5 V
    Dimensions 550 x 410 x 320 mm
    Weight 45 kg
    • Detection limit – 1 ppm
    • Measureable elements – S to U
    • Elemental content – 1 ppm to 99 %
    • Movable sample platform for easy detection of testing point
    • Built-in electric cooling Si-PIN detector
    • Safety features - optical tube shielding with no X-ray radiation and high voltage emergency locking

  • Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries

  • XRF-Spectrometer LXRF-A10

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  • Simultaneous detectorRange
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Handheld XRF Spectrometer LXRF-B10

Handheld XRF Spectrometer LXRF-B10
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  • ppm to 100%Content measurement range

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  • {"Optical type":"Czerny turner","Resolution":"\u2264 0.015nm (3600 line grating) \u2264 0.030nm (2400 line grating)","Focal length":"1000 mm","Grating specifications":"huge holographic grating with 3600 L\/mil or 2400 L\/mil and 80 mm \u00d7 100 mm of ruling area","Wavelength range":"195 to 500 nm for 3600 line grating 195 to 800 nm for 2400 line grating"}Monochromator Specifications
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XRF Spectrometer : Handheld XRF Spectrometer LXRF-B11
Handheld XRF Spectrometer LXRF-B11
  • Energy dispersive X-ray fluorescence analytical MethodAnalytical Method
  • Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measuredElements Measuring
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  • ppm to 99.99%Content measurement range
XRF Spectrometer : Handheld XRF Spectrometer LXRF-B10
Handheld XRF Spectrometer LXRF-B10
  • Energy dispersive X-ray fluorescence analytical MethodAnalytical Method
  • Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measuredElements Measuring
  • Simultaneous detectorRange
  • ppm to 100%Content measurement range
XRF Spectrometer : XRF-Spectrometer LXRF-A10

XRF-Spectrometer LXRF-A10
  • S to UMeasureable elements
  • 1 ppmDetection limit
  • 15 ~ 30 °CTemperature
  • 1 ppm to 99 %Elemental content