Atomic force microscope LAFM-A11

Atomic force microscope LAFM-A11 comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.

  • Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
    Scan angle 0 to 360°
    Maximum scan range X/Y axis: 50 µm, Z axis: 5 µm
    Optical system/ Magnification of CCD Magnification: 10x, Resolution: 1 µm
    Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
    Sample size Ø≤ 90 mm, H≤ 20 mm
    Sample movement 0 to 20 mm
    Pulse width of approaching motor 10 ± 2 ms
    Scan rate 0.6 Hz to 4.34 Hz
    Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
    Types of sampling pixel 256×256, 512×512
    Feedback type DSP digital feedback
    Feedback sampling rate 64 KHz
    PC connections: USB 2.0
    Windows software Compatible with windows 98/2000/XP/7/8
    Instrument Diemnsion 700 × 500 × 460 mm
    Net weight 50 kg
    Gross Weight 87.4 kg
    • Large sample transfer range
    • Optical observation system for checking tip & sample’s position
    • Modular electronic system for easy maintenance
    • CCD observing system
    • Equipped with servomotor to achieve CCD auto focusing
    • Provides highly accurate results
  • It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

Atomic force microscope LAFM-A10

  • Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angleOperation modes
  • Random angleScan angle
  • X/Y axis: 20 µm, Z axis: 2 µmMaximum scan range
  • Magnification: 4x, Resolution: 2.5 µmOptical system/ Magnification of CCD

Polarizing Microscope LPM-A11

  • Polarizing siedentopf trinocular head 30° inclined, eyepiece rotation 360°
    Interpupillary adjustable distance 48 to 76 mm
    Light distribution 100:1 (100% for eyepiece)
    Viewing Head
  • WF10X/20 mm, WF10X/20 mm (reticle 0.1 mm)Eyepiece
  • Quintuple, center adjustableNosepiece
  • Swing out type N.A. 0.9/0.13 polarizing unit, (with scale, rotable 3600, can be locked)Condenser

Polarizing Microscope LPM-A10

  • Siedentopf type binocular head, 30° inclined, eyepiece rotation 360º
    Interpupillary adjustable distance 50 to 75 mm
    Viewing Head
  • WF10X/20 mm, WF10X/20 mm (reticle 0.1 mm)Eyepiece
  • Quintuple click stop revolving mechanism with multiple ball bearingNosepiece
  • Swing type N.A. 1.25 with iris diaphragm and filterCondenser
Polarizing Microscope LPM-B10
  • Finite optical systemOptical System
  • Trinocular viewing head, 30° inclinedViewing head
  • Polarizer: Sliding in/out of optical path, located on the top of collector
    Analyzer: Rotatable analyzer with gradation 0°-90°
    Bertrand lens: Bertrand lens, sliding in/out of optical path
    Optical Compensator: λ Slip (first class red), 1/4λ Slip, Quartz wedge
    Polarizing Attachment
  • Eyepiece WF10X/18 with Division eyepiece 10X/18 mm 0.10 mm/divEyepiece
Metallurgical Microscope LMM-C10
  • Infinity Optical System F= 200 mmOptical System
  • Siedentopf trinocular head, inclined at 30°, Interpupillary 55-75 mmViewing Head
  • WF10X/25 mmEyepiece
  • M Plan APO HL Objective 2X/0.055 WD= 34.56 mm Focus Length 95mm
    M Plan APO HL Objective 5X/0.14 WD= 44.50 mm Focus Length 95mm
    M Plan APO HL Objective 10X/0.28 WD= 34.00 mm Focus Length 95mm
    M Plan APO HL Objective 20X/0.29 WD= 31.00 mm Focus Length 95mm
    M Plan APO HL Objective 50X/0.42 WD= 20.50 mm Focus Length 95mm
    Objective

Upright Metallurgical microscopes LMM-B11

  • Infinity Optical System
    (with Bright Field/ Dark Field, DIC, Polarizing units)
    Optical System
  • Seidentopf Trinocular Head Inclined at 30°,
    Interpupillary distance 48 to 75 mm
    Viewing Head
  • 24 V, 100 W Halogen Light,
    Brightness Adjustable, Kohler Illumination With Aspherical Condenser
    Polarizer & Analyzer,
    Integrate Board For Polarizer & Analyzer
    Blue, Green, Yellow Filter, Ground Glass filters
    Reflected Illumination
  • Swing-Out Condenser N.A.0.9/0.25
    24V 100 W Halogen Light With Aspherical Condenser
    Blue Filter
    Transmitted Illumination

Upright Metallurgical microscopes LMM-B12

  • Infinity Optical System
    (with Bright Field/ Dark Field, DIC, Polarizing units)
    Optical System
  • Seidentopf Trinocular Head Inclined at 30°,
    Interpupillary distance 48 to 75 mm
    Viewing Head
  • 24 V, 100 W Halogen Light,
    Brightness Adjustable, Kohler Illumination With Aspherical Condenser
    Polarizer & Analyzer,
    Integrate Board For Polarizer & Analyzer
    Blue, Green, Yellow Filter, Ground Glass filters
    Reflected Illumination
  • NilTransmitted Illumination
Digital Microscope LDM-B10
  • Binocular head, inclined at 20° , interpupillary distance 55-75 mmViewing head
  • EW10X/ Ø22 mmEyepiece
  • Plan achromatic objective: 1x
    Zoom objectives: 0.8x-5x with 1:6 zoom ratio
    Objectives
  • working distance: 78 mmStage
Digital Microscope LDM-B11
  • Binocular head, inclined at 20º , interpupillary distance 55-75 mmViewing head
  • EW10X/ Ø22 mmEyepiece
  • Plan achromatic objective: 1x
    Zoom objectives: 0.8x-6.4x with 1:8 zoom ratio
    Objectives
  • working distance: 78 mmStage

Digital Microscope LDM-B12

  • Binocular head, inclined at 20º , interpupillary distance 55-75 mmViewing head
  • EW10X/ Ø22 mmEyepiece
  • Plan achromatic objective: 1x
    Zoom objectives: 0.8x-8x with 1:10 zoom ratio
    Objectives
  • working distance: 78 mmStage

Atomic force microscope LAFM-A11

  • Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°Operation modes
  • 0 to 360°Scan angle
  • X/Y axis: 50 µm, Z axis: 5 µmMaximum scan range
  • Magnification: 10x, Resolution: 1 µmOptical system/ Magnification of CCD
Atomic force microscope LAFM-A10
  • Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angleOperation modes
  • Random angleScan angle
  • X/Y axis: 20 µm, Z axis: 2 µmMaximum scan range
  • Magnification: 4x, Resolution: 2.5 µmOptical system/ Magnification of CCD
Inverted Metallurgical Microscope LIMM-A10
  • Infinity color correct optical systemOptical System
  • 45˚ inclined trinocular viewing head, 360˚ rotatable interpupillary distance 50 to 75 mm, binocular trinocular 100:0 or 0:100Viewing Head
  • High eye point wide field plan eyepiece PL10X 22 mm, with adjustable diopter, reticle attachableEyepiece
  • Long working distance plan achromatic metallurgical objectives 5X, 10X, 20X, 50X, 100XObjective